A semi-automatic technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described. It is based primarily on the projected reciprocal lattice geometry, but also utilizes the intensity of reflections that are extracted from precession-enhanced electron diffraction spot patterns of polycrystalline materials and multi-material composites. At the core of the method, experimental (precession-enhanced) electron diffraction spot patterns are cross correlated with pre-calculated templates for a set of model structures. The required hardware facilitates a scanning-precession movement of the primary electron beam on the polycrystalline and/or multi-material sample and can be interfaced to any newer or older mid-voltage TEM. The software that goes with this hardware is so flexible in its intake of experimental data that it can also create crystallite orientation and phase maps of nanocrystals from the amplitude part of Fourier transforms of high resolution TEM images. Experimentally obtained crystallite orientation and phase maps are shown for a clausthalite nanocrystal powder sample, polycrystalline aluminum and copper films, fine-grained palladium films, as well as MnAs crystallites that are partly embedded in a GaAs wafer. Comprehensive open-access and commercial crystallographic databases that may provide reference data in support of the nanocrystal phase identification process of the software are briefly mentioned.