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Contribution to Book
Precession Electron Diffraction & Automated Crystallite Orientation/phase Mapping in a Transmission Electron Microscope
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on (2011)
  • Peter Moeck, Portland State University
  • S. Rouvimov
  • I. Hausler
  • W. Neumann
  • S. Nicolopoulos
Abstract
The basics of precession electron diffraction (PED) in a transmission electron microscope (TEM) are briefly discussed. An automated system for the mapping of nanocrystal phases and orientations in a TEM is briefly described. This system is primarily based on the projected reciprocal lattice geometry as extracted from experimental precession electron diffraction spot patterns. Comprehensive open-access crystallographic databases may be used in support of the automated crystallite phase identification process and are, therefore, also briefly mentioned.
Keywords
  • Transmission electron microscopy,
  • Electrons -- Diffraction,
  • Crystallography,
  • Nanometrology
Disciplines
Publication Date
August, 2011
Publisher
IEEE
ISBN
978-1-4577-1515-0
Publisher Statement
© Copyright IEEE
Citation Information
Peter Moeck, S. Rouvimov, I. Hausler, W. Neumann, et al.. "Precession Electron Diffraction & Automated Crystallite Orientation/phase Mapping in a Transmission Electron Microscope" Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on (2011)
Available at: http://works.bepress.com/peter_moeck/39/