Contribution to Book
Precession Electron Diffraction & Automated Crystallite Orientation/phase Mapping in a Transmission Electron MicroscopeNanotechnology (IEEE-NANO), 2011 11th IEEE Conference on (2011)
The basics of precession electron diffraction (PED) in a transmission electron microscope (TEM) are briefly discussed. An automated system for the mapping of nanocrystal phases and orientations in a TEM is briefly described. This system is primarily based on the projected reciprocal lattice geometry as extracted from experimental precession electron diffraction spot patterns. Comprehensive open-access crystallographic databases may be used in support of the automated crystallite phase identification process and are, therefore, also briefly mentioned.
- Transmission electron microscopy,
- Electrons -- Diffraction,
Publication DateAugust, 2011
Citation InformationPeter Moeck, S. Rouvimov, I. Hausler, W. Neumann, et al.. "Precession Electron Diffraction & Automated Crystallite Orientation/phase Mapping in a Transmission Electron Microscope" Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on (2011)
Available at: http://works.bepress.com/peter_moeck/39/