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Article
Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-kinematic Limit
Microscopy and Microanalysis (2012)
  • Peter Moeck, Portland State University
  • Jack Straton, Portland State University
  • S. Rouvimov, Portland State University
  • I. Haeusler
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Keywords
  • Crystals -- Structure,
  • Electrons -- Diffraction
Disciplines
Publication Date
July, 2012
Publisher Statement
Copyright © Microscopy Society of America 2012
Citation Information
Peter Moeck, Jack Straton, S. Rouvimov and I. Haeusler. "Crystallite Thickness Estimates from Precession Electron Diffraction Patterns for Structural Fingerprinting in the Quasi-kinematic Limit" Microscopy and Microanalysis Vol. 18 Iss. Supplement S2 (2012)
Available at: http://works.bepress.com/peter_moeck/34/