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Selected Works of Peter M. Hoffmann
Article
Energy dissipation in Atomic Force Microscopy and Atomic Loss Processes
Physical Review Letters (2001)
  • Peter M. Hoffmann
  • Ahmet Oral
  • John B. Pethica
Link
Abstract
Atomic scale dissipation is of great interest in nanomechanics and atomic manipulation. We present dissipation measurements with a linearized, ultrasmall amplitude atomic force microscope which is capable of measuring dissipation at chosen, fixed separations. We show that the dynamic dissipation in the noncontact regime is of the order of a few 10–100 meV per cycle. This dissipation is likely due to the motion of a bistable atomic defect in the tip-surface region. In the contact regime we observe dc hysteresis associated with nanoscale plasticity. We find the hysteretic energy loss to be 1 order of magnitude higher for a silicon surface than for copper.
Disciplines
Publication Date
2001
DOI
https://doi.org/10.1103/PhysRevLett.87.265502
Citation Information
Peter M. Hoffmann, Ahmet Oral and John B. Pethica. "Energy dissipation in Atomic Force Microscopy and Atomic Loss Processes" Physical Review Letters (2001)
Available at: http://works.bepress.com/peter_m_hoffmann/31/