Article
Dynamics of small amplitude, off-resonance AFM
Applied Surface Science
(2003)
Abstract
Most current non-contact-atomic force microscopy (nc-AFM) techniques rely on vibrating the measuring lever at resonance using amplitudes that are large compared to typical interaction length scales. Here we present results of simulations that show that off-resonance, small amplitude AFM provides an alternative non-contact technique in which force gradients can be measured directly without the need of mathematical de-convolution. We show that under a wide range of reasonable conditions the measurements are linear and quantitative.
Disciplines
Publication Date
2003
DOI
https://doi.org/10.1016/S0169-4332(02)01494-0
Citation Information
Peter M. Hoffmann. "Dynamics of small amplitude, off-resonance AFM" Applied Surface Science (2003) Available at: http://works.bepress.com/peter_m_hoffmann/30/