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Selected Works of Peter M. Hoffmann
Article
Small-Amplitude Atomic Force Microscopy
Advanced Engineering Materials (2005)
  • Peter M. Hoffmann
  • Shivprasad V. Patil
Link
Abstract
Small amplitude Atomic Force Microscopy (AFM) is a relatively new AFM technique which was specifically developed to perform linear measurements of nanomechanical phenomena. This is achieved by using ultra-small cantilever amplitudes and very high sensitivity deflection sensors. Recently this technique has been used in ultra-high vacuum (UHV) and liquid environments to measure atomic and molecular forces and dynamics with high precision. Here we focus on three examples which are interesting from a nanoengineering standpoint: Atomic energy dissipation (atomic friction), atomic-scale contact mechanics, and nanotribology/molecular ordering in confined liquid films.
Disciplines
Publication Date
2005
DOI
https://doi.org/10.1002/adem.200500054
Citation Information
Peter M. Hoffmann and Shivprasad V. Patil. "Small-Amplitude Atomic Force Microscopy" Advanced Engineering Materials (2005)
Available at: http://works.bepress.com/peter_m_hoffmann/27/