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A novel approach for x-ray scattering experiments in magnetic fields utilizing trapped flux in type-II superconductors
Review of Scientific Instruments
  • R. K. Das, Argonne National Laboratory
  • Z. Islam, Argonne National Laboratory
  • J. P. C. Ruff, Argonne National Laboratory
  • R. P. Sawh, University of Houston
  • R. Winstein, University of Houston
  • Paul C. Canfield, Iowa State University
  • J.-W. Kim, Argonne National Laboratory
  • J. C. Lang, Argonne National Laboratory
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We introduce a novel approach to x-ray scattering studies in applied magnetic fields by exploiting vortices in superconductors. This method is based on trapping magnetic flux in a small disk-shaped superconductor (known as a trapped field magnet, TFM) with a single-crystal sample mounted on or at close proximity to its surface. This opens an unrestricted optical access to the sample and allows magnetic fields to be applied precisely along the x-ray momentum transfer, facilitating polarization-sensitive experiments that have been impractical or impossible to perform to date. The TFMs used in our study remain stable and provide practically uniform magnetic fields for days, which are sufficient for comprehensive x-ray diffraction experiments, specifically x-ray resonance exchange scattering (XRES) to study field-induced phenomena at a modern synchrotron source. The TFM instrument has been used in a “proof-of-principle” XRES study of a meta-magnetic phase in a rare-earth compound, TbNi2Ge2, in order to demonstrate its potential.

The following article appeared in Review of Scientific Instruments 83 (2012): 065103 and may be found at

Copyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
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American Institute of Physics
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R. K. Das, Z. Islam, J. P. C. Ruff, R. P. Sawh, et al.. "A novel approach for x-ray scattering experiments in magnetic fields utilizing trapped flux in type-II superconductors" Review of Scientific Instruments Vol. 83 Iss. 6 (2012) p. 065103
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