Article
Are nanophase grain boundaries anomalous?
Physical Review Letters
(1995)
Abstract
The grain boundary regions of nanophase Cu metal are investigated using the x-ray absorption fine structure (XAFS) technique. Typical samples made by standard techniques need to be greatly thinned if measured in transmission in order to eliminate experimental artifacts which erroneously lower the apparent coordination number. To avoid this problem the samples were measured by the total electron yield technique. The results indicate a grain boundary structure which, on the average, is similar to that in conventional polycrystalline Cu, contrary to previous XAFS measurements made in transmission which indicated a lower coordination number.
Disciplines
Publication Date
February 14, 1995
DOI
10.1103/PhysRevLett.75.3874
Publisher Statement
©1995 American Physical Society. Publisher's version of record: https://doi.org/10.1103/PhysRevLett.75.3874
Citation Information
Paul G. Sanders, E. A. Stern, R. W. Siegel, M. Newville, et al.. "Are nanophase grain boundaries anomalous?" Physical Review Letters Vol. 75 Iss. 21 (1995) p. 3874 ISSN: 1079-7114 Available at: http://works.bepress.com/paul-sanders/51/