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Article
Positron annihilation study of the influence of grain size and purity on the annealing behaviour of nano-crystalline copper
Materials Science Forum (1997)
  • Paul G. Sanders, Northwestern University
  • M. M. Eldrup, Rise National Laboratory
  • J. R. Weertman, Northwestern University
Keywords
  • Copper (Cu),
  • Defect,
  • Grain Size,
  • Nanocrystal,
  • Positron Annihilation,
  • Purity
Publication Date
September, 1997
DOI
10.4028/www.scientific.net/MSF.255-257.436
Publisher Statement
© Trans Tech Publications Inc. Publisher's version of record: https://dx.doi.org/10.4028/www.scientific.net/MSF.255-257.436
Citation Information
Paul G. Sanders, M. M. Eldrup and J. R. Weertman. "Positron annihilation study of the influence of grain size and purity on the annealing behaviour of nano-crystalline copper" Materials Science Forum Vol. 255/257 (1997) p. 436 - 438 ISSN: 1662-9752
Available at: http://works.bepress.com/paul-sanders/47/