Article
Creep of nanocrystalline Cu, Pd, and Al-Zr
Nanostructured Materials
(1998)
Abstract
Creep tests were carried out over a range of temperatures (0.24 – 0.64 Tm) and stresses on samples of nanocrystalline Cu, Pd, and Al-Zr made by inert gas condensation and compaction. The measured creep rates are two to four orders of magnitude smaller than the values predicted by the equation for Coble creep. At moderate temperatures, the creep rates are comparable or lower than the corresponding coarse-grain rates. Except for the tests performed at the highest homologous temperatures, all creep curves can be fit by the equation for logarithmic creep. The samples in the as-prepared state are highly twinned, and it is believed that the prevalence of low-energy grain boundaries together with inhibition of dislocation activity caused by the small grain sizes are responsible for the low strain rates.
Disciplines
Publication Date
May 15, 1998
DOI
10.1016/S0965-9773(97)00096-2
Publisher Statement
© 1997 Acta Metallurgica Inc. Publisher's version of record: https://doi.org/10.1016/S0965-9773(97)00096-2
Citation Information
Paul G. Sanders, M. Rittner, E. Kiedaisch, J. R. Weertman, et al.. "Creep of nanocrystalline Cu, Pd, and Al-Zr" Nanostructured Materials Vol. 9 Iss. 1-8 (1998) p. 433 - 440 ISSN: 9780080914237 Available at: http://works.bepress.com/paul-sanders/36/