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Article
Transmission electron microscopy characterization of nanocrystalline copper
Advanced Materials for the 21st Century (1999)
  • H. Kung, Los Alamos National Laboratory
  • Paul G. Sanders, Harvard University
  • J. R. Weertman, Northwestern University
Abstract
The microstructure and grain boundary structure of nanocrystalline Cu powders and a compact prepared by the inert-gas condensation technique have been characterized by transmission electron microscopy. The as-prepared particles are round in shape and have no distinct surface facets. Annealing twins (coherent Z3 boundaries) have been observed in the as-prepared Cu particles as well as in the compact. Pores are commonly found at grain boundaries, triple grain
junctions and some in the interior of grains in the compact. In addition to twin boundaries, a number of special grain boundaries have been observed. These special grain boundaries have low-index interface planes, and sometimes have misorientation angles close to coincidence site lattice (CSL) orientations.
Publication Date
1999
Publisher Statement
Publisher’s version of record: http://digital.library.unt.edu/ark:/67531/metadc707139/
Citation Information
H. Kung, Paul G. Sanders and J. R. Weertman. "Transmission electron microscopy characterization of nanocrystalline copper" Advanced Materials for the 21st Century (1999)
Available at: http://works.bepress.com/paul-sanders/27/