Skip to main content
profile image
Selected Works of Paul Sanders
Article
Dislocations in submicron grain size and nanocrystalline copper
Materials Research Society Online Proceedings Library (2011)
  • T. Ungár, Eötvös University Budapest
  • G. Tichy, Eötvös University Budapest
  • Paul G. Sanders, Harvard University
  • J. R. Weertman, Northwestern University Evanston
Abstract
Using the dislocation model of strain anisotropy in X-ray diffraction peak profile analysis it is shown that in nanocrystalline copper produced by inert gas condensation dislocations are present, at least, down to average grain sizes of the order of 20 nm. Based on the analysis of the dislocation contrast factors it is suggested that with decreasing grain size the proportion of Lomer-Cottrell type dislocations increases.
Disciplines
Publication Date
March 1, 2011
DOI
10.1557/PROC-634-B1.7.1
Publisher Statement
© Materials Research Society 2001. Publisher’s version of record:https://doi.org/10.1557/PROC-634-B1.7.1
Citation Information
T. Ungár, G. Tichy, Paul G. Sanders and J. R. Weertman. "Dislocations in submicron grain size and nanocrystalline copper" Materials Research Society Online Proceedings Library Vol. 634 (2011)
Available at: http://works.bepress.com/paul-sanders/26/