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Article
Liquid titanium solute diffusion measured by pulsed ion-beam melting
Metallurgical and Materials Transactions A (1999)
  • Paul G. Sanders, Ford Motor Company
  • M. O. Thompson, Cornell University
  • T. J. Renk, Sandia National Laboratories
  • M. J. Aziz, Harvard University
Abstract
The diffusivities of Sn, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the range of 5 to 9×10−5 cm2/s were determined at temperatures in the range of 2200 to 2500 K. Calculations of buoyancy and Marangoni convection indicate that convective contamination is unlikely.
Publication Date
October 7, 1999
DOI
10.1007/s11661-001-0171-1
Publisher Statement
© ASM International & TMS-The Minerals, Metals and Materials Society 2001. Publisher’s version of record: http://dx.doi.org/10.1007/s11661-001-0171-1
Citation Information
Paul G. Sanders, M. O. Thompson, T. J. Renk and M. J. Aziz. "Liquid titanium solute diffusion measured by pulsed ion-beam melting" Metallurgical and Materials Transactions A Vol. 32 Iss. 12 (1999) p. 2969 - 2974 ISSN: 1073-5623
Available at: http://works.bepress.com/paul-sanders/24/