Presentation
Terrestrial measurements of diffusivities in refractory melts by pulsed melting of thin films
Proceedings of the Microgravity Materials Science Conference 2000
(2000)
Abstract
Laterally homogeneous pulsed melting of thin films is being investigated as a way to eliminate convection and thereby determine diffusivities in refractory mels under terrestrial conditions, providing comparison data for microgravity measurements. The silicon liquid self-diffusivity was determined by pulsed laser melting for 30Si+ experimental concentration spatial profile given the initial concentration profile and the temporal melt-depth profile. The silicon liquid self-diffusivity at the melting point (4.0 plus or minus 0.5) X 10-4cm2/s. Calculations of Buoyancy and Marangoni convection indicate that convective contamination is unlikely.
Disciplines
Publication Date
2000
Location
Huntsville, Alabama
Comments
Publisher's version of record: http://nrs.harvard.edu/urn-3:HUL.InstRepos:2795721
Citation Information
Paul G. Sanders and Michael J. Aziz. "Terrestrial measurements of diffusivities in refractory melts by pulsed melting of thin films" Proceedings of the Microgravity Materials Science Conference 2000 (2000) Available at: http://works.bepress.com/paul-sanders/21/