Article
Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)
Physical Review B
Document Type
Article
Disciplines
Publication Date
1-1-2008
DOI
10.1103/PhysRevB.77.033402
Abstract
Scanning tunneling microscopy studies are integrated with development of a realistic atomistic model to both characterize and elucidate the complex mounded morphologies formed by deposition of Ag on Ag(111) at 150 and 180 K. Threefold symmetric lateral shapes of islands and mounds are shown to reflect the influence of a nonuniform step edge barrier inhibiting interlayer transport. Modeling of structure at the mound peaks leads to a sensitive estimate of the magnitude of this large barrier.
Copyright Owner
American Physical Society
Copyright Date
2008
Language
en
File Format
application/pdf
Citation Information
Maozhi Li, P.-W. Chung, E. Cox, Cynthia J. Jenks, et al.. "Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)" Physical Review B Vol. 77 Iss. 3 (2008) p. 033402 Available at: http://works.bepress.com/patricia_thiel/30/
This article is from Physical Review B 77, no. 3 (2008): 033402, doi:10.1103/PhysRevB.77.033402.