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Diffraction paradox: An unusually broad diffraction background marks high quality graphene
Physical Review B
  • Shen Chen, Iowa State University and Ames Laboratory
  • Michael Horn-von Hoegen, University of Duisburg-Essen
  • Patricia A. Thiel, Iowa State University and Ames Laboratory
  • Michael C. Tringides, Iowa State University and Ames Laboratory
Document Type
Article
Publication Version
Published Version
Publication Date
10-15-2019
DOI
10.1103/PhysRevB.100.155307
Abstract

The realization of the unusual properties of two-dimensional (2D) materials requires the formation of large domains of single-layer thickness, extending over the mesoscale. It is found that the formation of uniform graphene on SiC, contrary to textbook diffraction, is signaled by a strong bell-shaped component (BSC) around the (00) and G(10) spots (but not around the substrate spots). The BCS is also seen on graphene grown on metals, because a single uniform graphene layer can be also grown with large lateral size. It is only seen by electron diffraction but not with x-ray or He scattering. Although the origin of such an intriguing result is unclear, its presence in the earlier literature (but never mentioned) points to its robustness and significance. A likely mechanism relates to the the spatial confinement of the graphene electrons, within a single layer. This leads to large spread in their wave vector which is transferred by electron-electron interactions to the elastically scattered electrons to generate the BSC.

Comments

This article is published as Chen, S., M. Horn von Hoegen, P. A. Thiel, and M. C. Tringides. "Diffraction paradox: An unusually broad diffraction background marks high quality graphene." Physical Review B 100, no. 15 (2019): 155307. DOI: 10.1103/PhysRevB.100.155307. Posted with permission.

Copyright Owner
American Physical Society
Language
en
File Format
application/pdf
Citation Information
Shen Chen, Michael Horn-von Hoegen, Patricia A. Thiel and Michael C. Tringides. "Diffraction paradox: An unusually broad diffraction background marks high quality graphene" Physical Review B Vol. 100 Iss. 15 (2019) p. 155307
Available at: http://works.bepress.com/patricia_thiel/168/