The fabrication and characterization of a novel metamaterial that shows negative index in the visible (blue) is reported. The real part of the negative index of this metamaterial at 405 nm, comprising co-sputtered SiC + Ag nanoparticle mixture on a glass substrate, is deduced from results of double Michelson interferometry setup which shows a negative phase delay. It is numerically verified that this metamaterial can yield near-field super-resolution imaging for both TE and TM polarizations.