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Contribution to Book
"SPICE Parameter Extraction from Automated Measurement of JFET and MOSFET Characteristics in The Computer-Integrated-Electronics Laboratory
Proceedings of the ASEE (1994)
  • Mustafa G. Guvench, University of Southern Maine
Abstract
This paper describes a procedure to extract major SPICE parameters of a field-effect transistor (JFET, MESFET or MOSFET) from its transfer and output i-v characteristics while introducing a technique that facilitates an accurate measurement of these characteristics with the help of standard bench-top electronic test equipment in a computer-integrated-electronics laboratory. The measurement technique, by requiring the availability of a function generator and only one digital-multi-meter (DMM) creates a means to do a quick and inexpensive determination of the SPICE parameters of field-effect transistors in-situ for computer-assisted electronics design. The technique and the extraction procedure have been tested and incorporated intothe electronics laboratory experiments at the University of Southern Maine.
Disciplines
Publication Date
1994
Publisher
The ASEE
Publisher Statement
Session 1659
Citation Information
Mustafa G. Guvench. ""SPICE Parameter Extraction from Automated Measurement of JFET and MOSFET Characteristics in The Computer-Integrated-Electronics Laboratory" Proceedings of the ASEE (1994)
Available at: http://works.bepress.com/mustafa_guvench/1/