Contribution to Book
"SPICE Parameter Extraction from Automated Measurement of JFET and MOSFET Characteristics in The Computer-Integrated-Electronics LaboratoryProceedings of the ASEE (1994)
AbstractThis paper describes a procedure to extract major SPICE parameters of a field-effect transistor (JFET, MESFET or MOSFET) from its transfer and output i-v characteristics while introducing a technique that facilitates an accurate measurement of these characteristics with the help of standard bench-top electronic test equipment in a computer-integrated-electronics laboratory. The measurement technique, by requiring the availability of a function generator and only one digital-multi-meter (DMM) creates a means to do a quick and inexpensive determination of the SPICE parameters of field-effect transistors in-situ for computer-assisted electronics design. The technique and the extraction procedure have been tested and incorporated intothe electronics laboratory experiments at the University of Southern Maine.
Citation InformationMustafa G. Guvench. ""SPICE Parameter Extraction from Automated Measurement of JFET and MOSFET Characteristics in The Computer-Integrated-Electronics Laboratory" Proceedings of the ASEE (1994)
Available at: http://works.bepress.com/mustafa_guvench/1/