Article
Local structural phase determination of Ni silicide thin films using EXAFS
Physica Status Solidi (c)
(2012)
Disciplines
Publication Date
October 1, 2012
DOI
10.1002/pssc.201200250
Citation Information
M. A. Sahiner, P. Y. Hung, W.-Y. Loh, P. S. Lysaght, et al.. "Local structural phase determination of Ni silicide thin films using EXAFS" Physica Status Solidi (c) Vol. 9 (2012) p. 2184 - 2188 Available at: http://works.bepress.com/mehmet_sahiner/20/