X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigationSurface Science (2006)
Multiple scattering theory based on a cluster model is used to simulate full hemispherical x-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(111) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations.
- Photoelectron diffraction,
- multiple scattering,
Citation InformationL. Despont, D. Naumovi´c, F. Clerc, C. Koitzsch, et al.. "X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation" Surface Science Vol. 600 Iss. 2 (2006) p. 380 - 385 ISSN: 00396028
Available at: http://works.bepress.com/mavanhove/82/