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X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation
Surface Science (2006)
  • L. Despont, Institut de Physique, Universit´e de Neuchˆatel, Rue A.-L. Breguet 1, CH-2000 Neuchˆatel, Switzerland
  • D. Naumovi´c, Institut de Physique, Universit´e de Fribourg, P´erolles, CH-1700 Fribourg, Switzerland
  • F. Clerc, Institut de Physique, Universit´e de Neuchˆatel, Rue A.-L. Breguet 1, CH-2000 Neuchˆatel, Switzerland
  • C. Koitzsch, Institut de Physique, Universit´e de Neuchˆatel, Rue A.-L. Breguet 1, CH-2000 Neuchˆatel, Switzerland
  • M. G. Garnier, Institut de Physique, Universit´e de Neuchˆatel, Rue A.-L. Breguet 1, CH-2000 Neuchˆatel, Switzerland
  • F. J. A. Garcia de Abajo, Centro Mixto CSIC-UPV/EHU, 20080 San Sebastia´ n, Spain
  • M.A. Van Hove, Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong
  • P. Aebi, Institut de Physique, Universit´e de Neuchˆatel, Rue A.-L. Breguet 1, CH-2000 Neuchˆatel, Switzerland
Abstract
Multiple scattering theory based on a cluster model is used to simulate full hemispherical x-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(111) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations.
Keywords
  • Photoelectron diffraction,
  • multiple scattering,
  • copper
Disciplines
Publication Date
2006
DOI
10.1016/j.susc.2005.10.038
Citation Information
L. Despont, D. Naumovi´c, F. Clerc, C. Koitzsch, et al.. "X-ray photoelectron diffraction study of Cu(111): Multiple scattering investigation" Surface Science Vol. 600 Iss. 2 (2006) p. 380 - 385 ISSN: 00396028
Available at: http://works.bepress.com/mavanhove/82/