"Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations" by Martina Schmeling

Article

Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations

(2011)

Martina Schmeling
Donald S. Burnett
A. J. G. Jurewicz

Link

Disciplines

Materials Science and Engineering and
Analytical Chemistry

Publication Date

January 1, 2011

Citation Information

Martina Schmeling, Donald S. Burnett and A. J. G. Jurewicz. "Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations" (2011)
Available at: http://works.bepress.com/martina-schmeling/7/