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Full-wave Simulation Of An Imbalanced Differential Microstrip Line With Conductor Surface Roughness
2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015
  • Marina Koledintseva, Missouri University of Science and Technolgoy
  • Tracey Vincent
  • Sergiu Radu
Abstract

This study investigates the full-wave numerical electromagnetic analysis of edge-coupled differential microstrip lines on a printed circuit board (PCB), when conductor surface roughness is taken into account. Mixed mode parameters of such lines are analyzed. The imbalance in the electric lengths of the traces causes the appearance of common-mode currents, as well as mode conversion: differential mode (DM) to common-mode (CM) and CM to DM. The presence of the solder mask on top of the PCB with microstrip traces is also taken into account. The differential lines modeled in this work are of three types: straight, bent, and curved. The signal traces are modeled with rectangular cross-section, as well as with the more realistic trapezoidal. The effect of surface roughness on the mode conversion is studied numerically in this work.

Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
978-147991991-8
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
5-13-2015
Publication Date
13 May 2015
Citation Information
Marina Koledintseva, Tracey Vincent and Sergiu Radu. "Full-wave Simulation Of An Imbalanced Differential Microstrip Line With Conductor Surface Roughness" 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015 (2015) p. 34 - 39
Available at: http://works.bepress.com/marina-koledintseva/115/