Local Grain Orientation and Strain in Polycrystalline YBa2Cu3O7−δ Superconductor Thin Films Measured by Raman SpectroscopyJournal of Applied Physics
AbstractWe report direct measurements of local grain orientation and residual strain in polycrystalline,C-axis oriented thin YBa2Cu3O7−δ superconducting films using polarized Raman spectroscopy. Strain dependence of the Ag Raman active mode at 335 cm−1 was calibrated and used to measure local strain in the films. Our data showed that high quality films are associated with the connected path of uniform grain orientation (single crystal-like) across the film and uniform residual strain in the range of −0.3%. Nonuniform grain orientation or high angle grain boundaries and nonuniform local strains were associated with low quality films.
Citation InformationMaher S. Amer, John F. Maguire, L. Cai, Rand R. Biggers, et al.. "Local Grain Orientation and Strain in Polycrystalline YBa2Cu3O7−δ Superconductor Thin Films Measured by Raman Spectroscopy" Journal of Applied Physics Vol. 89 Iss. 12 (2001) p. 8030 - 8034 ISSN: 00218979
Available at: http://works.bepress.com/maher_amer/24/