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Article
Local Grain Orientation and Strain in Polycrystalline YBa2Cu3O7−δ Superconductor Thin Films Measured by Raman Spectroscopy
Journal of Applied Physics
  • Maher S. Amer, Wright State University - Main Campus
  • John F. Maguire
  • L. Cai
  • Rand R. Biggers
  • Steven Leclair
Document Type
Article
Publication Date
1-1-2001
Abstract
We report direct measurements of local grain orientation and residual strain in polycrystalline,C-axis oriented thin YBa2Cu3O7−δ superconducting films using polarized Raman spectroscopy. Strain dependence of the Ag Raman active mode at 335 cm−1 was calibrated and used to measure local strain in the films. Our data showed that high quality films are associated with the connected path of uniform grain orientation (single crystal-like) across the film and uniform residual strain in the range of −0.3%. Nonuniform grain orientation or high angle grain boundaries and nonuniform local strains were associated with low quality films.
DOI
10.1063/1.1371946
Citation Information
Maher S. Amer, John F. Maguire, L. Cai, Rand R. Biggers, et al.. "Local Grain Orientation and Strain in Polycrystalline YBa2Cu3O7−δ Superconductor Thin Films Measured by Raman Spectroscopy" Journal of Applied Physics Vol. 89 Iss. 12 (2001) p. 8030 - 8034 ISSN: 00218979
Available at: http://works.bepress.com/maher_amer/24/