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Article
Cause and Effects of Voltage Collapse -- Case Studies with Dynamic Simulations
Proceedings of the IEEE Power Engineering Society General Meeting (2004, Denver, Colorado)
  • Feng Dong
  • Mariesa Crow, Missouri University of Science and Technology
  • Badrul H. Chowdhury, Missouri University of Science and Technology
  • Levent Acar, Missouri University of Science and Technology
Abstract
Voltage collapse studies are made to gain an insight into mechanisms that drive a system into collapse. The inter-play of generator controls in local and external areas are explored. Simulations are carried out on a medium sized network by a transient dynamic simulation program. Simulation results help to better understand remediation strategies. The time dependent characteristics of corrective controls are investigated.
Meeting Name
IEEE Power Engineering Society General Meeting (2004: Jun. 6-10, Denver, CO)
Department(s)
Electrical and Computer Engineering
Sponsor(s)
National Science Foundation (U.S.)
Comments
Supported in part by the U.S. National Science Foundation under Grant ECS-9975713
Keywords and Phrases
  • Load Tap Changer,
  • Over Excitation Limiter,
  • Preventive Control,
  • Reactive Power Margin,
  • Stability Margin
International Standard Book Number (ISBN)
780384652
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2004
Publication Date
01 Jan 2004
Citation Information
Feng Dong, Mariesa Crow, Badrul H. Chowdhury and Levent Acar. "Cause and Effects of Voltage Collapse -- Case Studies with Dynamic Simulations" Proceedings of the IEEE Power Engineering Society General Meeting (2004, Denver, Colorado) Vol. 2 (2004) p. 1806 - 1812
Available at: http://works.bepress.com/levent-acar/9/