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Presentation
NDE of additively manufactured components with embedded defects (reference standards) using conventional and advanced ultrasonic methods
AIP Conference Proceedings
  • Lucas Koester, Iowa State University
  • Ronald A. Roberts, Iowa State University
  • Daniel J. Barnard, Iowa State University
  • Sunil Kishore Chakrapani, Iowa State University
  • Surendra Singh, Honeywell Aerospace
  • Robert Hogan, Honeywell Aerospace
  • Leonard J. Bond, Iowa State University
Document Type
Conference Proceeding
Conference
43nd Annual Review of Progress in Quantitative Nondestructive Evaluation
Publication Version
Published Version
Publication Date
1-1-2017
DOI
10.1063/1.4974721
Conference Title
43nd Annual Review of Progress in Quantitative Nondestructive Evaluation
Conference Date
July 17-22, 2016
Geolocation
(33.7489954, -84.3879824)
Abstract

Additive manufacturing provides a unique opportunity to embed defects of known size and shape to produce reference samples for inspection and quality control purposes. This paper reports defect detectability studies with cylindrical additively manufactured cobalt-chromium alloy specimens which contain defects of known sizes and distributions. The specimens were characterized using immersion, synthetic aperture focusing (SAFT), phased array, and nonlinear ultrasonic techniques. Results include detectability, signal to noise ratios, and comparison of results between the methods and what is believed to be the first determination of a non-linearity (beta) parameter for an additively manufactured material. The results indicate that additive manufacturing provides a valuable method to produce reference samples, though additional work is required to validate the shape and morphology of the defects specified.

Comments

This proceeding may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This proceeding appeared in Koester, Lucas, Ronald A. Roberts, D. J. Barnard, Sunil Chakrapani, Surendra Singh, Robert Hogan, and L. J. Bond. "NDE of additively manufactured components with embedded defects (reference standards) using conventional and advanced ultrasonic methods." In AIP Conference Proceedings 1806, no. 1 (2017): 140006. DOI: 10.1063/1.4974721. Posted with permission.

Copyright Owner
The Author(s)
Language
en
File Format
application/pdf
Citation Information
Lucas Koester, Ronald A. Roberts, Daniel J. Barnard, Sunil Kishore Chakrapani, et al.. "NDE of additively manufactured components with embedded defects (reference standards) using conventional and advanced ultrasonic methods" Atlanta, GAAIP Conference Proceedings Vol. 1806 Iss. 1 (2017) p. 140006
Available at: http://works.bepress.com/leonard_bond/74/