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Presentation
Temperature dependence of electromechanical impedance based bond-line integrity monitoring
Proceedings of SPIE
  • Prathamesh N. Bilgunde, Iowa State University
  • Leonard J. Bond, Iowa State University
Document Type
Conference Proceeding
Conference
SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring
Publication Version
Published Version
Publication Date
4-5-2017
DOI
10.1117/12.2260365
Conference Title
Health Monitoring of Structural and Biological Systems
Conference Date
March 25-29, 2017
Geolocation
(45.5230622, -122.67648150000002)
Abstract

Electromechanical impedance (EMI) is an important technique for bond-line integrity monitoring of adhesively bonded joints in automotive and aerospace structures. In the current work, numerical analysis of temperature sensitivity of the EMI technique is performed. The objective is to detect stiffness reduction of the adhesive in the presence of temperature and external mechanical load. Increase in the operating temperature can degrade the bonded piezoelectric material causing misinterpretation of the EMI data. EMI Signal features are numerically investigated to decouple the effect of load and temperature on the piezoelectric material in the mechanically loaded bonded joint. The computational results indicate higher dependence of EM resonance spectrum towards piezoelectric material matrix as compared to the tensile load applied on the bonded sample as the stiffness of adhesive is numerically varied.

Comments

This proceeding is published as Prathamesh Bilgunde, Leonard J. Bond, "Temperature dependence of electromechanical impedance based bond-line integrity monitoring," Proc. SPIE 10170, Health Monitoring of Structural and Biological Systems 2017, 101702Y (5 April 2017). doi: 10.1117/12.2260365. Posted with permission.

Copyright Owner
Society of Photo-Optical Instrumentation Engineers (SPIE)
Language
en
File Format
application/pdf
Citation Information
Prathamesh N. Bilgunde and Leonard J. Bond. "Temperature dependence of electromechanical impedance based bond-line integrity monitoring" Portland, ORProceedings of SPIE Vol. 10170 Iss. 101702Y (2017) p. 101702Y-1 - 101702Y-11
Available at: http://works.bepress.com/leonard_bond/53/