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Article
Detection of Corrosion‐Related Defects in Aluminum Using Positron Annihilation Spectroscopy
Journal of the Electrochemical Society
  • X. Wu, Iowa State University
  • P. Asoka-Kumar, Brookhaven National Laboratory
  • Kelvin Lynn, Brookhaven National Laboratory
  • Kurt R. Hebert, Iowa State University
Document Type
Article
Disciplines
Publication Date
1-1-1994
DOI
10.1149/1.2059340
Abstract

Near‐surface atomic‐scale defects in aluminum foils of at least 99.98% purity were characterized with positron annihilation spectroscopy measurements of the Doppler‐broadening parameter S. Profiles of S vs. positron beam energy (i.e., vs. depth into the sample) were analyzed with a model for positron diffusion and trapping in order to characterize the defect layer structure. As‐received foils were shown to possess a defect layer within 10 to 100 nm of the oxide film/metal interface. Both dissolution in aqueous sodium hydroxide solution and anodic pitting corrosion in caused significant changes in the position spectra which were interpreted as increases in the defect population. On the basis of isochronal annealing, the defects were impurity‐complexed voids or vacancy clusters, or else interfacial voids at the metal/film boundary located at surface roughness features. Either case suggests a possible role for the defects as pit sites, since both near‐surface impurities and surface roughness are known to influence the number of pits on a surface. Defects found after pitting may be present in layers surrounding individual pits, and might have been produced in the process of pit initiation.

Comments

This article is from Journal of the Electrochemical Society 141 (1994): 3361–3368, doi:10.1149/1.2059340. Posted with permission.

Copyright Owner
ECS—The Electrochemical Society
Language
en
Date Available
2014-02-10
File Format
application/pdf
Citation Information
X. Wu, P. Asoka-Kumar, Kelvin Lynn and Kurt R. Hebert. "Detection of Corrosion‐Related Defects in Aluminum Using Positron Annihilation Spectroscopy" Journal of the Electrochemical Society Vol. 141 Iss. 12 (1994) p. 3361 - 3368
Available at: http://works.bepress.com/kurtr_hebert/26/