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Article
Diffracted moiré fringes as analysis and alignment tools for multilayer fabrication in soft lithography
Applied Physics Letters
  • Jae-Hwang Lee, Iowa State University
  • Chang-Hwan Kim, Iowa State University
  • Yong-Sung Kim, Iowa State University
  • Kai-Ming Ho, Iowa State University
  • Kristen P. Constant, Iowa State University
  • Wai Y. Leung, Iowa State University
  • Cha-Hwan Oh, Hanyang University
Document Type
Article
Publication Date
1-1-2005
DOI
10.1063/1.1927268
Abstract

We studied the first-order diffractedmoiré fringes of transparent multilayered structures comprised of irregularly deformed periodic patterns. By a comparison study of the diffractedmoiré fringe pattern and detailed microscopy of the structure, we show that the diffractedmoiré fringe can be used as a nondestructive tool to analyze the alignment of multilayered structures. We demonstrate the alignment method for the case of layer-by-layer microstructures using soft lithography. The alignment method yields high contrast of fringes even when the materials being aligned have very weak contrasts. The imaging method of diffractedmoiré fringes is a versatile visual tool for the microfabrication of transparent deformable microstructures in layer-by-layer fashion.

Comments

The following article appeared in Applied Physics Letters 86 (2005): 204101 and may be found at http://dx.doi.org/10.1063/1.1927268.

Rights
Copyright 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Copyright Owner
American Institute of Physics
Language
en
File Format
application/pdf
Citation Information
Jae-Hwang Lee, Chang-Hwan Kim, Yong-Sung Kim, Kai-Ming Ho, et al.. "Diffracted moiré fringes as analysis and alignment tools for multilayer fabrication in soft lithography" Applied Physics Letters Vol. 86 Iss. 20 (2005) p. 204101
Available at: http://works.bepress.com/kristen_constant/2/