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Article
Structural characterization of thin film photonic crystals
Physical Review B
  • G. Subramania, Iowa State University
  • Rana Biswas, Iowa State University
  • Kristen P. Constant, Iowa State University
  • M. M. Sigalas, Iowa State University
  • Kai-Ming Ho, Iowa State University
Document Type
Article
Publication Date
5-23-2001
DOI
10.1103/PhysRevB.63.235111
Abstract

We quantitatively analyze the structure of thin film inverse-opal photonic crystals composed of ordered arrays of air pores in a background of titania. Ordering of the sphere template and introduction of the titania background were performed simultaneously in the thin film photonic crystals. Nondestructive optical measurements of backfilling with high refractive index liquids, angle-resolved reflectivity, and optical spectroscopy were combined with band-structure calculations. The analysis reveals a thin film photonic crystal structure with a very high filling fraction (92–94 %) of air and a substantial compression along the c axis (∼22–25%).

Comments

This article is from Physical Review B 63 (2001): 235111, doi:10.1103/PhysRevB.63.235111. Posted with permission.

Copyright Owner
American Physical Society
Language
en
File Format
application/pdf
Citation Information
G. Subramania, Rana Biswas, Kristen P. Constant, M. M. Sigalas, et al.. "Structural characterization of thin film photonic crystals" Physical Review B Vol. 63 (2001) p. 235111
Available at: http://works.bepress.com/kristen_constant/14/