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Article
Fast Method for EIS Sweep Test
Proceedings of the 7th Asia-Pacific International Symposium on Electromagnetic Compatibility (2016, Shenzhen, China)
  • Penghui Shen
  • Zixin Liu
  • Yihong Qi, Missouri University of Science and Technology
  • Wei Yu
  • Jun Fan, Missouri University of Science and Technology
Abstract

This paper proposed a novel fast band-sweep measurement method for efficient isotropic sensitivity (EIS) of wireless devices. The method is built on the facts that the relationship between the bit error rate (BER) and the received power is generally consistent in the same band, and the EIS values at a fixed angle is slowly-changing on the frequency except harmonics. Therefore, only few frequency points are required to be measured for a whole band sweep test resulting in a significantly decrease in measurement time.

Meeting Name
7th Asia-Pacific International Symposium on Electromagnetic Compatibility (2016: May 17-21, Shenzhen, China)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Electromagnetic compatibility,
  • efficient isotropic sensitivity,
  • Fast methods,
  • harmonics,
  • Measurement time,
  • Received power,
  • Sweep measurements,
  • Sweep tests,
  • Wireless devices,
  • Bit error rate,
  • band-sweep test
International Standard Book Number (ISBN)
978-146739494-9
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
5-1-2016
Publication Date
01 May 2016
Citation Information
Penghui Shen, Zixin Liu, Yihong Qi, Wei Yu, et al.. "Fast Method for EIS Sweep Test" Proceedings of the 7th Asia-Pacific International Symposium on Electromagnetic Compatibility (2016, Shenzhen, China) (2016) p. 800 - 803
Available at: http://works.bepress.com/jun-fan/74/