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Article
Far-End Crosstalk Analysis for Stripline with Inhomogeneous Dielectric Layers (IDL)
Proceedings of the 2021 Joint IEEE International Symposium on EMC/SI/PI, and EMC Europe (2021, Raleigh, NC)
  • Yuanzhuo Liu
  • Shaohui Yong
  • Yuandong Guo
  • Jiayi He
  • Liang Liu
  • Nick Kutheis
  • Albert Sutono
  • Vijay Kunda
  • Amy Luoh
  • Yunhui Chu
  • Xiaoning Ye
  • DongHyun Kim, Missouri University of Science and Technology
  • Jun Fan, Missouri University of Science and Technology
Abstract

Far-end crosstalk (FEXT) noise is a critical factor that affects signal integrity performance in high-speed systems. The FEXT level is sensitive to the dielectric inhomogeneity of the stripline in fabricated printed circuit boards (PCB). Stripline is typically modeled as a 2-layer model with core and prepreg layers. However, in reality, the stripline is laminated by multiple inhomogeneous dielectric layers (IDL). The dielectric layers of the stripline are laminated with epoxy resin and glass bundles. The dielectric permittivity (ϵr) of the epoxy resin and glass bundles are different, which causes the inhomogeneity of the dielectric layers while also increasing the FEXT magnitude. Therefore, a typical 2-layer structure is inaccurate to model the FEXT. In this paper, the stripline model is constructed with the core, prepreg, and resin pocket layers. To analyze the stripline with three IDL, a practical superposition method is proposed. A design guideline to mitigate the FEXT level in the stripline design is proposed based on the method.

Meeting Name
2021 IEEE International Joint Electromagnetic Compatibility Signal and Power Integrity and EMC Europe Symposium, EMC/SI/PI/EMC Europe 2021 (2021: Jul. 26-Aug. 13, Raleigh, NC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Comments
National Science Foundation, Grant IIP-1916535
Keywords and Phrases
  • Dielectric Material,
  • Far-End Crosstalk (FEXT),
  • Inhomogeneous Dielectric Layers (IDL),
  • Stripline
International Standard Book Number (ISBN)
978-166544888-8
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2021 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-13-2021
Publication Date
13 Aug 2021
Citation Information
Yuanzhuo Liu, Shaohui Yong, Yuandong Guo, Jiayi He, et al.. "Far-End Crosstalk Analysis for Stripline with Inhomogeneous Dielectric Layers (IDL)" Proceedings of the 2021 Joint IEEE International Symposium on EMC/SI/PI, and EMC Europe (2021, Raleigh, NC) (2021) p. 825 - 830
Available at: http://works.bepress.com/jun-fan/385/