Skip to main content
Article
Robust Extended Unterminated Line (EUL) Crosstalk Characterization Techniques for High-Speed Interconnect
Proceedings of the 2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity
  • Yuandong Guo
  • DongHyun Kim, Missouri University of Science and Technology
  • Jiayi He
  • Xiaoning Ye, Intel Corporation
  • Albert Sutono
  • Vijay Kunda
  • Amy Luoh
  • Zurab Kiguradze
  • Li Shen
  • Jun Fan, Missouri University of Science and Technology
Abstract

Extend Unterminated Line (EUL) structure allows crosstalk measurements with perfect termination and halves the number of test ports required by the traditional method. Therefore, EUL is a time-efficient and convenient structure for a test vehicle design of high-speed interconnects. In this paper, the potential errors in the EUL measurement are analyzed. In addition, an error detection method to check for causality, passivity and reciprocity is demonstrated. It is the first time to propose the best practices and robustness-enhancement techniques for EUL crosstalk characterization.

Meeting Name
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, EMCSI 2020 (2020: Jul. 27-31, Virtual)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Causality,
  • Crosstalk,
  • D-Probe,
  • Extend Unterminated Line,
  • Passivity,
  • Reciprocity,
  • Signal Integrity
International Standard Book Number (ISBN)
978-172817430-3
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2020 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
9-10-2020
Publication Date
10 Sep 2020
Citation Information
Yuandong Guo, DongHyun Kim, Jiayi He, Xiaoning Ye, et al.. "Robust Extended Unterminated Line (EUL) Crosstalk Characterization Techniques for High-Speed Interconnect" Proceedings of the 2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity (2020) p. 155 - 157
Available at: http://works.bepress.com/jun-fan/363/