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Article
Active Cooling of Metal Oxide Semiconductor Controlled Thyristor Using Venturi Flow
Journal of Propulsion and Power
  • Rengasamy Ponnappan, UES Inc.
  • John E. Leland, University of Dayton
  • Won Soon Chang, Wright Laboratory
  • J. E. Beam, Wright Laboratory
  • Bick T. Nguyen, Wright Laboratory
  • Joseph A. Weimer, Wright Laboratory
Document Type
Article
Publication Date
1-1-1996
Abstract

A metal oxide semiconductor controlled thyristor (MCT) is a solid-state high-current switching device. Because of its high-current and high-heat dissipation, this device requires an advanced cooling arrangement. A sample MCT device was successfully tested in a conduction mode up to 95 A using a new technique called venturi cooling.

Steady-state operational tests were performed under various coolant temperatures and flow rates. The highest device temperature was 168.5°C, whereas the power dissipation and heat flux were 170 W and 257 W/ cm2, respectively. Comparison with a commercial liquid-cooled cold plate showed that the cooling effectiveness is nearly double for the venturi flow. Measured junction-to-case thermal resistance of the MCT was 0.213°C/ W for venturi flow compared to 0.421°C/W for the commercial cold plate. Venturi flow cooling is highly recommended for MCT applications.

Inclusive pages
398-404
ISBN/ISSN
0748-4658
Comments

Permission documentation is on file.

Publisher
American Institute of Aeronautics and Astronautics
Peer Reviewed
Yes
Citation Information
Rengasamy Ponnappan, John E. Leland, Won Soon Chang, J. E. Beam, et al.. "Active Cooling of Metal Oxide Semiconductor Controlled Thyristor Using Venturi Flow" Journal of Propulsion and Power Vol. 12 Iss. 2 (1996)
Available at: http://works.bepress.com/john-leland/2/