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Article
Monte Carlo simulation of dislocation-nucleated etching of silicon {111} surfaces
MRS Proceedings
  • Donald L. Woodraska, Michigan Technological University
  • Jason Lacosse, Michigan Technological University
  • John A. Jaszczak, Michigan Technological University
Document Type
Conference Paper/Presentation
Publication Date
4-1-1995
Abstract

We investigate equilibrium properties and thermal etching of the {111} surfaces of silicon, both with and without perpendicular intersecting dislocations, using Monte Carlo computer simulation. A modified solid-on-solid (SOS) approach is employed which realizes the correct diamond-cubic (DC) crystal structure. Nearest-neighbor interactions are incorporated to model the bonding, while the effects of a dislocation are incorporated by the addition of an energy field modeled as a core region and an elastic strained region. Dislocations are seen to nucleate the etching process and result in the formation of etch pits. Etch rates and etch-pit morphologies are investigated as a function of the chemical potential driving force for etching, the temperature, and the energy parameters used to model the dislocation.

Publisher's Statement

© 1995 Materials Research Society. Publisher's version of record: http://dx.doi.org/10.1557/PROC-389-209

Citation Information
Donald L. Woodraska, Jason Lacosse and John A. Jaszczak. "Monte Carlo simulation of dislocation-nucleated etching of silicon {111} surfaces" MRS Proceedings Vol. 389 (1995) p. 209 - 214
Available at: http://works.bepress.com/john-jaszczak/29/