Light-Induced Defect States in Hydrogenated Amorphous Silicon Centered Around 1.0 and 1.2 eV from the Conduction Band EdgeApplied Physics Letters (2003)
To take into account the presence of multiple light-induced defect states in hydrogenated amorphous silicon(a-Si:H) the evolution of the entire spectra of photoconductive subgap absorption, α(hν), has been analyzed. Using this approach two distinctly different light-induced defect states centered around 1.0 and 1.2 eV from the conduction band edge are clearly identified. Results are presented on their evolution and respective effects on carrier recombination that clearly point to the importance of these states in evaluating the stability of different a-Si:Hsolar cell materials, as well as elucidating the origin of the Staebler–Wronski effect.
Publication DateNovember 3, 2003
Citation InformationJoshua M. Pearce, J. Deng, R. W. Collins and C. R. Wronski. "Light-Induced Defect States in Hydrogenated Amorphous Silicon Centered Around 1.0 and 1.2 eV from the Conduction Band Edge" Applied Physics Letters Vol. 83 Iss. 18 (2003)
Available at: http://works.bepress.com/jmpearce/66/