Zinc oxide (ZnO) has gained much interest recently due to its semiconductivity, optical transparency, and magneto-optic effects. Obtaining p-type ZnO has been a major obstacle to using ZnO in applications such as spintronics. ZnO films can be grown from a variety of precursors using spray pyrolysis. Certain chemical precursors may allow p-type ZnO to be grown. Preliminary electrical characterization results show intrinsic behavior in ZnO thin films grown by spray pyrolysis using a variety of precursors. Systematic characterization of the thin film ZnO will be performed using x-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM) and electrical conductivity type determination measurements. The crystallographic structure, electrical, and optical behavior will be determined and correlated to the chemical precursors. Several of the precursors studied may lead to p-type conduction in ZnO films. A reliable method for growing p-type ZnO may allow ZnO to be used in active semiconducting applications.
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