Demonstration of Magnetoelectric Scanning Probe MicroscopyReview of Scientific Instruments
AbstractA near-field room temperature scanning magnetic probe microscope has been developed using a laminated magnetoelectric sensor. The simple trilayer longitudinal-transverse mode sensor, fabricated using Metglas as the magnetostrictive layer and polyvinylidene fluoride as the piezoelectric layer, shows an ac field sensitivity of 467±3μV∕Oe in the measured frequency range of 200Hz–8kHz. The microscope was used to image a 2mm diameter ring carrying an ac current as low as 10−5A. ac fields as small as 3×10−10T have been detected.
Citation InformationJason R. Hattrick-Simpers, Liyang Dai, Manfred Wuttig, Ichiro Takeuchi, et al.. "Demonstration of Magnetoelectric Scanning Probe Microscopy" Review of Scientific Instruments Vol. 78 Iss. 10 (2007) p. #106103
Available at: http://works.bepress.com/jason_hattrick-simpers/6/