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High-Throughput Characterization of Shape Memory Thin Films using Automated Temperature-Dependent Resistance Measurements
MRS Proceedings
  • Sigurd Thienhaus
  • Christiane Zamponi
  • Holger Rumpf
  • Jason R. Hattrick-Simpers, University of South Carolina - Columbia
  • Ichiro Takeuchi
  • Alfred Ludwig
Publication Date
1-1-2005
Document Type
Article
Citation Information
Sigurd Thienhaus, Christiane Zamponi, Holger Rumpf, Jason R. Hattrick-Simpers, et al.. "High-Throughput Characterization of Shape Memory Thin Films using Automated Temperature-Dependent Resistance Measurements" MRS Proceedings Vol. 894 (2005) p. LL06-06
Available at: http://works.bepress.com/jason_hattrick-simpers/27/