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Article
Linear Current-Mode Active Pixel Sensor
Departmental Papers (ESE)
  • Ralf M Philipp, Johns Hopkins University
  • David Orr, Johns Hopkins University
  • Viktor Gruev, University of Pennsylvania
  • Jan Van der Spiegel, University of Pennsylvania
  • Ralph Etienne-Cummings, Johns Hopkins University
Abstract
A current mode CMOS active pixel sensor (APS) providing linear light-to-current conversion with inherently low fixed pattern noise (FPN) is presented. The pixel features adjustable-gain current output using a pMOS readout transistor in the linear region of operation. This paper discusses the pixel’s design and operation, and presents an analysis of the pixel’s temporal noise and FPN. Results for zero and first-order pixel mismatch are presented. The pixel was implemented in a both a 3.3 V 0.35 µm and a 1.8 V 0.18 µm CMOS process. The 0.35 µm process pixel had an uncorrected FPN of 1.4%/0.7% with/without column readout mismatch. The 0.18 µm process pixel had 0.4% FPN after delta-reset sampling (DRS). The pixel size in both processes was 10 X 10 µm2, with fill factors of 26% and 66%, respectively.
Document Type
Journal Article
Date of this Version
11-1-2007
Comments

Copyright 2007 IEEE. Reprinted from IEEE Journal on Solid State Circuits, Volume 42, Issue 11, November 2007, pages 2482-2491.

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Keywords
  • CMOS analog integrated circuits,
  • image sensors
Citation Information
Ralf M Philipp, David Orr, Viktor Gruev, Jan Van der Spiegel, et al.. "Linear Current-Mode Active Pixel Sensor" (2007)
Available at: http://works.bepress.com/jan_vanderspiegel/30/