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Article
EMI Coupling Paths and Mitigation in Optical Transceiver Modules
IEEE Transactions on Electromagnetic Compatibility
  • Ling Zhang
  • Xiao Li
  • Xiangyang Jiao
  • Jing Li
  • Sukhjinder S. Toor
  • Alpesh U. Bhobe
  • David Pommerenke, Missouri University of Science and Technology
  • James L. Drewniak, Missouri University of Science and Technology
Abstract

Optical transceiver modules are commonly used in telecommunication and data communication systems, and are among the most troublesome electromagnetic interference (EMI) problems for regulatory compliance at their operation frequencies and/or harmonics. In this study, simulations and measurements are performed on an optical subassembly module, including the silicon photonics submodule assembly, in order to identify and characterize the EMI coupling paths. The total radiated power is measured and computed. Through simulation and corroborating measurements, the dominant EMI coupling paths at high frequencies above 10 GHz are identified and characterized, and currents on the silicon photonic subassembly conductor housing and optical fiber connection ferrule are a dominant radiating source. EMI mitigation methods are developed and shown to be effective in reducing the radiated emissions from real product hardware.

Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Sponsor(s)

IEEE Electromagnetic Compatibility Society

Keywords and Phrases
  • Electromagnetic interference (EMI) coupling paths,
  • EMI sources,
  • Mitigation,
  • Optical transceiver modules,
  • Total radiated power (TRP)
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
12-1-2017
Publication Date
01 Dec 2017
Citation Information
Ling Zhang, Xiao Li, Xiangyang Jiao, Jing Li, et al.. "EMI Coupling Paths and Mitigation in Optical Transceiver Modules" IEEE Transactions on Electromagnetic Compatibility Vol. 59 Iss. 6 (2017) p. 1848 - 1855 ISSN: 0018-9375
Available at: http://works.bepress.com/james-drewniak/288/