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Selected Works of Jack C. Straton
Contribution to Book
Crystallographic Image Processing for Scanning Probe Microscopy: Development of a Dedicated Computer Program
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on (2011)
  • T. T. Bilyeu, Portland State University
  • B. Moon
  • Jack C. Straton, Portland State University
  • Peter Moeck, Portland State University
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Abstract
The crystallographic processing of 2D periodic Scanning Probe Microscopy (SPM) images is compared to the common practice of Crystallographic Image Processing (CIP) in transmission electron microscopy (TEM). This provides motivation for the development of a dedicated computer program for CIP in SPM. The current state of our program is briefly described, and the point spread function (PSF) of an atomic force microscope (AFM) is extracted from experimental images through CIP. The use of a geometric Akaike information criterion (AIC) to supplement standard CIP procedures is discussed in some detail.
Keywords
  • Atomic force microscopy,
  • Crystallography,
  • Transmission electron microscopy,
  • Optical transfer function,
  • Scanning probe micrscopy
Disciplines
Publication Date
August, 2011
Publisher
IEEE
ISBN
978-1-4577-1515-0
Publisher Statement
© Copyright IEEE
Citation Information
T. T. Bilyeu, B. Moon, Jack C. Straton and Peter Moeck. "Crystallographic Image Processing for Scanning Probe Microscopy: Development of a Dedicated Computer Program" Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on (2011)
Available at: http://works.bepress.com/jack_straton/39/