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Presentation
Characterizing the Intrinsic Variance of XRD Measurements for Grinding Processes
IIE Annual Conference (2004)
  • Iris V. Rivero, Iowa State University
  • Simon M. Hsiang, North Carolina State University at Raleigh
Abstract
This study models the statistical distribution of the errors associated with residual stress measurements collected by
x-ray diffraction (XRD) inspection procedures by evaluating the goodness of fit based on the Kolmogorov-Smirnov
statistic. The residual stress measurements were performed in D2 steel after repeated grindings. The resultant model is generalized and can be incorporated into additional assessments of residual stresses for various manufacturing procedures. The outcome of this study provides an efficient method to verify and validate XRD measurements.
Keywords
  • XRD,
  • residual stresses,
  • error distribution,
  • grinding
Disciplines
Publication Date
2004
Comments
This is a proceeding published as Iris V. Rivero and Simon M. Hsiang; Characterizing the Intrinsic Variance of XRD Measurements for Grinding Processes. IIE Annual Conference. Proceedings, 2004. Posted with permission.
Citation Information
Iris V. Rivero and Simon M. Hsiang. "Characterizing the Intrinsic Variance of XRD Measurements for Grinding Processes" IIE Annual Conference (2004)
Available at: http://works.bepress.com/iris_rivero/15/