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Presentation
First-class effect reflection for effect-guided programming
Proceedings of the 2016 ACM SIGPLAN International Conference on Object-Oriented Programming, Systems, Languages, and Applications
  • Yuheng Long, Iowa State University
  • Yu David Liu, State University of New York at Binghamton
  • Hridesh Rajan, Iowa State University
Document Type
Conference Proceeding
Conference
SPLASH Systems, Programming, and Applications
Publication Version
Submitted Manuscript
Link to Published Version
http://dx.doi.org/10.1145/2983990.2984037
Publication Date
10-20-2016
DOI
10.1145/3022671.2984037
Conference Title
The 2016 ACM SIGPLAN International Conference on Object-Oriented Programming, Systems, Languages, and Applications (OOPSLA 2016)
Conference Date
November 2-4, 2016
Geolocation
(52.3702157, 4.895167899999933)
Abstract

This paper introduces a novel type-and-effect calculus, first-class effects, where the computational effect of an expression can be programmatically reflected, passed around as values, and analyzed at run time. A broad range of designs “hard-coded” in existing effect-guided analyses — from thread scheduling, version-consistent software updating, to data zeroing — can be naturally supported through the programming abstractions. The core technical development is a type system with a number of features, including a hybrid type system that integrates static and dynamic effect analyses, a refinement type system to verify application-specific effect management properties, a double-bounded type system that computes both over-approximation of effects and their under-approximation. We introduce and establish a notion of soundness called trace consistency, defined in terms of how the effect and trace correspond. The property sheds foundational insight on “good” first-class effect programming.

Comments

This article is published as Long, Yuheng, Yu David Liu, and Hridesh Rajan. "First-class effect reflection for effect-guided programming." In Proceedings of the 2016 ACM SIGPLAN International Conference on Object-Oriented Programming, Systems, Languages, and Applications, pp. 820-837. ACM, 2016. doi: 10.1145/3022671.2984037. Posted with permission.

Rights
© ACM, 2016. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in Proceedings of the 2016 ACM SIGPLAN International Conference on Object-Oriented Programming, Systems, Languages, and Applications, 2016. https://doi.org/10.1145/2983990.2984037
Copyright Owner
ACM
Language
en
File Format
application/pdf
Citation Information
Yuheng Long, Yu David Liu and Hridesh Rajan. "First-class effect reflection for effect-guided programming" Amsterdam, The NetherlandsProceedings of the 2016 ACM SIGPLAN International Conference on Object-Oriented Programming, Systems, Languages, and Applications Vol. 51 Iss. 10 (2016) p. 820 - 837
Available at: http://works.bepress.com/hridesh-rajan/89/