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Presentation
Property-aware program sampling
PASTE '10 Proceedings of the 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
  • Harish Narayanappa, Iowa State University
  • Hridesh Rajan, Iowa State University
  • Mukul S. Bansal, Tel Aviv University
Document Type
Conference Proceeding
Conference
PASTE Program Analysis for Software Tools and Engineering
Publication Version
Accepted Manuscript
Link to Published Version
https://doi.org/10.1145/1806672.1806682
Publication Date
6-5-2010
DOI
10.1145/1806672.1806682
Conference Title
PASTE '10 The 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
Conference Date
June 5-6, 2010
Geolocation
(43.653226, -79.38318429999998)
Abstract

Monitoring or profiling programs provides us with an understanding for its further improvement and analysis. Typically, for monitoring or profiling, the program is instrumented to execute additional code that collects necessary data. However, a widely-understood problem with this approach is that program instrumentation can result in significant execution overhead. A number of techniques based on statistical sampling have been proposed to reduce this overhead. Statistical sampling based instrumentation techniques, although effective in reducing the overall overhead, often lead to poor coverage or incomplete results. The contribution of this work is a profiling technique that we call property-aware program sampling. Our sampling technique uses program slicing to reduce the scope of instrumentation and slice fragmentsto decompose large program slices into more manageable, logically related parts for instrumentation, thereby improving the scalability of monitoring and profiling techniques. The technical underpinnings of our work include the notion of slice fragments and an efficient technique for computing a reduced set of slice fragments.

Comments

This article is published as Narayanappa, Harish, Mukul S. Bansal, and Hridesh Rajan. "Property-aware program sampling." In Proceedings of the 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering, pp. 45-52. ACM, 2010. 10.1145/1806672.1806682. Posted with permission.

Rights
© ACM, 2010. This is the author's version of the work. It is posted here by permission of ACM for your personal use. Not for redistribution. The definitive version was published in Proceedings of the 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering, pp. 45-52. ACM, 2010. https://doi.org/10.1145/1806672.1806682
Copyright Owner
ACM
Language
en
File Format
application/pdf
Citation Information
Harish Narayanappa, Hridesh Rajan and Mukul S. Bansal. "Property-aware program sampling" Toronto, Ontario, CAPASTE '10 Proceedings of the 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering (2010) p. 45 - 52
Available at: http://works.bepress.com/hridesh-rajan/106/