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Monte Carlo Uncertainty Analysis for Photothermal Radiometry Measurements using a Curve Fit Process
Metrologia
  • K. Horne
  • A. Fleming
  • B. Timmins
  • Heng Ban, Utah State University
Document Type
Article
Publication Date
1-1-2015
Abstract

Photothermal radiometry (PTR) has become a popular method to measure thermal properties of layered materials. Much research has been done to determine the capabilities of PTR, but with little uncertainty analysis. This study reports a Monte Carlo uncertainty analysis to quantify uncertainty of film diffusivity and effusivity measurements, presents a sensitivity study for each input parameter, compares linear and logarithmic spacing of data points on frequency scans, and investigates the validity of a one-dimensional heat transfer assumption. Logarithmic spacing of frequencies when taking data is found to be unequivocally superior to linear spacing, while the use of a higher-dimensional heat transfer model is only needed for certain measurement configurations. The sensitivity analysis supports the frequency spacing conclusion, as well as explains trends seen in the uncertainty data.

Citation Information
K. Horne, A. Fleming, B. Timmins and Heng Ban. "Monte Carlo Uncertainty Analysis for Photothermal Radiometry Measurements using a Curve Fit Process" Metrologia (2015)
Available at: http://works.bepress.com/heng-ban/61/