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Characterization of thin film deposition processes in RF and DC sputtering using optical emission spectroscopy
Bulletin of the American Physical Society (2011)
  • Amruta Nawarange
  • Hasitha Mahabaduge
  • Kristopher Wieland
  • Alvin Compaan
Publication Date
April 16, 2011
Citation Information
Amruta Nawarange, Hasitha Mahabaduge, Kristopher Wieland and Alvin Compaan. "Characterization of thin film deposition processes in RF and DC sputtering using optical emission spectroscopy" Bulletin of the American Physical Society (2011)
Available at: http://works.bepress.com/hasitha-mahabaduge/28/