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Contribution to Book
Effect of Modulation Frequency on Detecting Defects in Metal Plates Using Infrared Lock-In Thermography
Proceedings of the International Symposium on Advanced Optical Manufacturing and Testing Technologies (2009)
  • Hui Liu, Harbin Institute of Technology
  • Yang Wang, Harbin Institute of Technology
  • Junyan Liu, Harbin Institute of Technology
  • Haijun Gong, Georgia Southern University
Abstract
Infrared lock-in thermography is a novel non-destruction testtechnique (NDT). It allows for defect detection in subsurface of structures. This technique depends on transmission and reflection of periodic heat flux which is launched into the inspection structure. Defects can be indicated by comparing phases of surface temperature. Heat conduction model is utilized to describe the transmitting process of sinusoidal (cosinusoidal) modulated heat flux in metal plates. Effect of modulation frequency on detection depth and detectivity is investigated. Experiments are carried out to inspect metal plates with artificial defects in room-temperature. A sinusoidal (cosinusoidal) modulated lamp is used as active heat source. Image sequences are collected by infrared camera and processed to obtain lock-in phase image by Cedip Infrared System. In frequency domain, phase images can be used to analyze the effects of modulation frequency on detecting defects in different size and depth. Experiments indicate that the detectivity will be reduced if the modulation frequency is lowered in order to detect deeper defects. A method is proposed to achieve deeper detection depth and higher detectivity, in order to obtain accurate results.
Keywords
  • Effect,
  • Modulation frequency,
  • Detecting defects,
  • Metal plates,
  • Infrared lock-in thermography
Disciplines
Publication Date
May 20, 2009
Editor
Yudong Zhang, James C. Wyant, Robert A. Smythe, and Hexin Wang
Publisher
SPIE
DOI
10.1117/12.828780
Citation Information
Hui Liu, Yang Wang, Junyan Liu and Haijun Gong. "Effect of Modulation Frequency on Detecting Defects in Metal Plates Using Infrared Lock-In Thermography" Proceedings of the International Symposium on Advanced Optical Manufacturing and Testing Technologies Vol. 7283 (2009)
Available at: http://works.bepress.com/haijun-gong/26/