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Article
Vanadium Oxide Thin-Film Variable Resistor-Based RF Switches
IEEE Transactions on Electron Devices
  • KuanChang Pan, University of Dayton
  • Weisong Wang, University of Dayton
  • Eunsung Shin, University of Dayton
  • Kelvin Freeman, University of Dayton
  • Guru Subramanyam, University of Dayton
Document Type
Article
Publication Date
9-1-2015
Abstract

Vanadium dioxide (VO2) is a unique phase change material (PCM) that possesses a metal-to-insulator transition property. Pristine VO2 has a negative temperature coefficient of resistance, and it undergoes an insulator-to-metal phase change at a transition temperature of 68°C. Such a property makes the VO2 thin-film-based variable resistor (varistor) a good candidate in reconfigurable electronics to be integrated with different RF devices such as inductors, varactors, and antennas. Series single-pole single-throw (SPST) switches with integrated VO2 thin films were designed, fabricated, and tested. The overall size of the device is 380 μm × 600 μm. The SPST switches were fabricated on a sapphire substrate with integrated heating coil to control VO2 phase change. During the test, when VO2 thin film changed from insulator at room temperature to metallic state (low-resistive phase) at 80 °C, the insertion loss of the SPST switch wasaddition, the isolation of the SPST improved to better than 30 dB when the temperature dropped to 20 °C. These tunable characteristics of the RF switch provide evidence for VO2 as a useful PCM for of applications in reconfigurable electronics.

Inclusive pages
2959-2965
ISBN/ISSN
0018-9383
Document Version
Postprint
Comments

The document available for download is the authors' accepted manuscript, provided in compliance with IEEE's policy on self-archiving. Permission documentation is on file. Some differences may exist between this version and the published version; as such, those wishing to quite directly from this source are advised to consult the version of record.

Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

This work was supported by the Air Force Research Laboratory Sensors Directorate through the AFRL Research Collaboration Program under Contract FA8650-13-C-5800.

Publisher
IEEE
Peer Reviewed
Yes
Keywords
  • Coplanar waveguide (CPW),
  • metal–insulator transition (MIT),
  • switch,
  • thin film,
  • vanadium dioxide (VO2),
  • variable resistor (varistor)
Citation Information
KuanChang Pan, Weisong Wang, Eunsung Shin, Kelvin Freeman, et al.. "Vanadium Oxide Thin-Film Variable Resistor-Based RF Switches" IEEE Transactions on Electron Devices Vol. 62 Iss. 9 (2015)
Available at: http://works.bepress.com/guru_subramanyam/39/