Article
A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies
Ferroelectrics
Document Type
Article
Publication Date
1-1-2007
Abstract
Read More: http://www.worldscientific.com/doi/abs/10.1142/S179329200900154X
Inclusive pages
153-157
ISBN/ISSN
0015-0193
Publisher
Taylor & Francis Group
Peer Reviewed
Yes
Keywords
- Varactor shunt switches,
- capacitive test structure,
- microwave characterization of ferroelectric thin films
Disciplines
Citation Information
Guru Subramanyam. "A New Method for Electrical Characterization of Ferroelectric Thin Films at Microwave Frequencies" Ferroelectrics Vol. 356 Iss. 1 (2007) Available at: http://works.bepress.com/guru_subramanyam/35/