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Article
Analytical HFET I-V Model in Presence of Current Collapse
IEEE Transactions on Electron Devices
  • A. Koudymov
  • M. S. Shur
  • Grigory Simin, University of South Carolina - Columbia
  • Kanin Chu
  • P.C. Chao
  • Taehun Lee
  • J. Jimenez
  • A. Balistreri
Publication Date
3-1-2008
Document Type
Article
Citation Information
A. Koudymov, M. S. Shur, Grigory Simin, Kanin Chu, et al.. "Analytical HFET I-V Model in Presence of Current Collapse" IEEE Transactions on Electron Devices Vol. 55 Iss. 3 (2008) p. 712 - 720
Available at: http://works.bepress.com/grigory_simin/26/